Handbook of Ionization Spectra
CONTENT
PREFACE
 
1. PHYSICAL ASPECTS OF IONIZATION SPECTROSCOPY TECHNIQUE
1.1. The nature of ionization spectra
1.2. The role of elastic scattering in ionization spectrum formation for reflection geometry
1.3. Inelastic electron scattering
1.4. IL contour
1.5. Fine structure of ionization spectrum
1.6. Ionization losses
1.7. Opportunities of ionization spectroscopy
 
2. IONIZATION SPECTROSCOPY EQUIPMENT
2.1. Electron spectrometer
2.2. Electron gun
 
3. IL DETECTION
3.1. Detection specifics
3.2. Acceleration voltage fluctuations
3.3. Auger lines suppression
 
4. ADJUSTMENT OF SPECTROMETER'S ELECTRON OPTICS
 
5. SPECTROMETER CALIBRATION
5.1. The goal of calibration
5.2. Calibration of kinetic energy scale
5.3. Electron energy loss scale
5.4. Inspection of spectrometer’s adjustment and calibration
 
6. INTENSITY OF IONIZATION LINES
6.1. IL intensity
6.2. Primary electron energy selection
 
7. SURFACE ANALYSIS BY MEANS OF IS
7.1. Qualitative composition analysis technique
7.2. Standard samples technique
7.3. Elemental sensitivity coefficients technique
7.4. Analysis depth
7.5. Investigation of chemical bonding between the atoms
 
References
Ionisation Spectroscopy: Physical Background and Usage (Contents) On-line Library of IS spectra Info System Software and Library   About Authors

PHYSICAL CONSTANTS WINDOW OF THE HANDBOOK'S SOFTWARE APPLICATION

In this window one can find the list of binding energies (in eV) for the isolated atoms of the given element along with its atomic weight and density (under normal conditions).
On the right to the list a calculator is placed for mean free path and effective analysis depth (for the case of primary electrons normal incidence and secondary electrons normal ejection).
The calculation of mean free path (in angstroms) is done with expression:

where a - is an average monolayer thickness in angstroms:

where M - atomic weight; Na - Avogadro's number; - density (gramm/cubic cm).
Energy E - is in electron-Volts.

Along with the electrons mean free path an effective analysis depth is also calculated under assumption that primary electrons a normally incident on the sample and the detection of ejected electrons also happens near the surface's normal. See also paragraph 7.4.

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"Handbook of Ionization Spectra"
ISBN 966-02-1954-7
© T. Afanasieva, I. Koval,V. Lysenko, P. Mel'nik, N. Nakhodkin, M. Pyatnitsky
Ukrainian National Academy of Science, Ukrainian Ministry of Education and Science
Taras Schevchenko University, Radiophysical department
tel.: +38(044)526-05-60
e-mail: afanasieva@univ.kiev.ua