Handbook of Ionization Spectra
CONTENT
PREFACE
 
1. PHYSICAL ASPECTS OF IONIZATION SPECTROSCOPY TECHNIQUE
1.1. The nature of ionization spectra
1.2. The role of elastic scattering in ionization spectrum formation for reflection geometry
1.3. Inelastic electron scattering
1.4. IL contour
1.5. Fine structure of ionization spectrum
1.6. Ionization losses
1.7. Opportunities of ionization spectroscopy
 
2. IONIZATION SPECTROSCOPY EQUIPMENT
2.1. Electron spectrometer
2.2. Electron gun
 
3. IL DETECTION
3.1. Detection specifics
3.2. Acceleration voltage fluctuations
3.3. Auger lines suppression
 
4. ADJUSTMENT OF SPECTROMETER'S ELECTRON OPTICS
 
5. SPECTROMETER CALIBRATION
5.1. The goal of calibration
5.2. Calibration of kinetic energy scale
5.3. Electron energy loss scale
5.4. Inspection of spectrometer’s adjustment and calibration
 
6. INTENSITY OF IONIZATION LINES
6.1. IL intensity
6.2. Primary electron energy selection
 
7. SURFACE ANALYSIS BY MEANS OF IS
7.1. Qualitative composition analysis technique
7.2. Standard samples technique
7.3. Elemental sensitivity coefficients technique
7.4. Analysis depth
7.5. Investigation of chemical bonding between the atoms
 
References
Ionisation Spectroscopy: Physical Background and Usage (Contents) On-line Library of IS spectra Info System Software and Library   About Authors

6. INTENSITY OF IONIZATION LINES

6.2. Primary electron energy selection

As it follows from (6.1.2) the IL intensity depends on the primary electron energy Ep. First, the non-elastic scattering cross section growth while the primary electron energy Ep increases, reaches the maximum at and then decreases. The EBE factor is monotonically decreasing with Ep growth for light elements, and can have a maximum at Ep =300..600 eV for heavy elements. The effective analysis depth for Ep>100 eV is increasing as energy growth. Analysis of all those factors (including related to measurement setup) has shown that while making surface investigations with IS technique it is better to select the values of Ep in the range of 0.2..2 keV.


Look further: 7. SURFACE ANALYSIS BY MEANS OF IS

"Handbook of Ionization Spectra"
ISBN 966-02-1954-7
© T. Afanasieva, I. Koval,V. Lysenko, P. Mel'nik, N. Nakhodkin, M. Pyatnitsky
Ukrainian National Academy of Science, Ukrainian Ministry of Education and Science
Taras Schevchenko University, Radiophysical department
tel.: +38(044)526-05-60
e-mail: afanasieva@univ.kiev.ua