Handbook of Ionization Spectra
CONTENT
PREFACE
 
1. PHYSICAL ASPECTS OF IONIZATION SPECTROSCOPY TECHNIQUE
1.1. The nature of ionization spectra
1.2. The role of elastic scattering in ionization spectrum formation for reflection geometry
1.3. Inelastic electron scattering
1.4. IL contour
1.5. Fine structure of ionization spectrum
1.6. Ionization losses
1.7. Possibilities of ionization spectroscopy
 
2. IONIZATION SPECTROSCOPY INSTRUMENTATION
2.1. Electron spectrometer
2.2. Electron gun
 
3. IL DETECTION
3.1. Detection specifics
3.2. Acceleration voltage fluctuations
3.3. Auger lines suppression
 
4. ADJUSTMENT OF SPECTROMETER'S ELECTRON OPTICS
 
5. SPECTROMETER CALIBRATION
5.1. The goal of calibration
5.2. Calibration of kinetic energy scale
5.3. Electron energy loss scale
5.4. Inspection of spectrometer’s adjustment and calibration
 
6. INTENSITY OF IONIZATION LINES
6.1. IL intensity
6.2. Primary electron energy selection
 
7. SURFACE ANALYSIS BY MEANS OF IS
7.1. Qualitative composition analysis technique
7.2. Standard samples technique
7.3. Elemental sensitivity coefficients technique
7.4. Analysis depth
7.5. Investigation of chemical bonding between the atoms
 
References
Ionisation Spectroscopy: Physical Background and Usage (Contents) On-line Library of IS spectra Info System Software and Library   About Authors

REFERENCES

  • 1. Gerlach R.L. Ionization spectroscopy of contaminated metal surfaces //J. Vac.Sci. Tecnol. 1971. 8, A4. P. 599-604; Gerlach R.L., Du Charme A.R. Backscattering cross section for ionization of surface atom K-shells by electron impact // Phys. Rev. 1972. A6, 5. P. 1892-1901.


  • 2. Atlas ionizatsionnih spectrov. Koval I.F., Lysenko V.N., Melnik P.V., Nakhodkin N.G.; Edited by Nakhodkin N.G.// Kiev: Vyscha Shkola. Kiev University Publishing, 1989.-p. 232.


  • 3. Ionizatsionnaja spectroscopija. Edited by Nakhodkin N.G.// Kiev: Lybid, 1992. - p. 212.


  • 4. Koval I.F., Lysenko V.N., Melnik P.V., Nakhodkin N.G. The influence of elastic scattering on the ionization lines intensities in the secondary electrons reflection spectrum //Ukrainian Physical Journal 1987. 32, 2. p. 235-238.


  • 5. Tanuma S., Powell C.J., Penn D.R. Calculation of Electron Inelastic Mean Free Paths. P.I, II, III, IV, V. Surface and Interfaces Analysis 1988. 11, p.577; 1991. 17, p.911-926; 1991, 17, 927-939; 1993. 20, p.77-89; 1994.


  • 6. Nakhodkin N.G., Melnik P.V. Elastic electron backscattering //Journal of Electron Spectroscopy and Related Phenomena 1994. 68, p.623-639.


  • 7. De Crescensi M. Extended energy loss fine structures (EELFS): a new structural probe for surfaces and interfaces. // Surface Science 1985. 162, 4. P. 838-846; Local structural investigation of surfaces and interfaces //Ultramicroscopy 1989. 28. N1, p.65-71.


  • 8. Carlson T.A. Photoelectron and Auger Spectroscopy. Plenum Press New York and London. 1978.


  • 9. Handbook of Auger electron spectroscopy. Davies L.E.m Mac-Donald N.C., Palmberg P.W., Weber R.E. et al. // Eden, 1976. P.144.


  • 10. M.P.Seah, G.C.Smith and M.T.Anthony // Surf. Interface Anal., 15 (1990) 293
"Handbook of Ionization Spectra"
ISBN 966-02-1954-7
© T. Afanasieva, I. Koval,V. Lysenko, P. Mel'nik, N. Nakhodkin, M. Pyatnitsky
Ukrainian National Academy of Science, Ukrainian Ministry of Education and Science
Taras Schevchenko University, Radiophysical department
tel.: +38(044)526-05-60
e-mail: afanasieva@univ.kiev.ua