Handbook of Ionization Spectra
CONTENT
PREFACE
 
1. PHYSICAL ASPECTS OF IONIZATION SPECTROSCOPY TECHNIQUE
1.1. The nature of ionization spectra
1.2. The role of elastic scattering in ionization spectrum formation for reflection geometry
1.3. Inelastic electron scattering
1.4. IL contour
1.5. Fine structure of ionization spectrum
1.6. Ionization losses
1.7. Opportunities of ionization spectroscopy
 
2. IONIZATION SPECTROSCOPY EQUIPMENT
2.1. Electron spectrometer
2.2. Electron gun
 
3. IL DETECTION
3.1. Detection specifics
3.2. Acceleration voltage fluctuations
3.3. Auger lines suppression
 
4. ADJUSTMENT OF SPECTROMETER'S ELECTRON OPTICS
 
5. SPECTROMETER CALIBRATION
5.1. The goal of calibration
5.2. Calibration of kinetic energy scale
5.3. Electron energy loss scale
5.4. Inspection of spectrometer’s adjustment and calibration
 
6. INTENSITY OF IONIZATION LINES
6.1. IL intensity
6.2. Primary electron energy selection
 
7. SURFACE ANALYSIS BY MEANS OF IS
7.1. Qualitative composition analysis technique
7.2. Standard samples technique
7.3. Elemental sensitivity coefficients technique
7.4. Analysis depth
7.5. Investigation of chemical bonding between the atoms
 
References
Ionisation Spectroscopy: Physical Background and Usage (Contents) On-line Library of IS spectra Info System Software and Library   About Authors

ELEMENTAL SENSITIVITY METHOD

The elemental sensitivity method is based on the following expressions
(1)
(2)
where N - is the number of elements in the sample, k - summing index, j - index of the element of interest. Finding the ration of IL intensities by means of (7.2.2) and substituting it into (2) yields
(3)
assuming the knowledge of elemental sensitivity coefficients Sj, EBE factors and the IL intensities Ij.
(4)
It was also assumed that and and also that transmission functions are not very much different while measuring the sample and the elemental standard. In this case the elemental sensitivity coefficients Sj are determined by physical parameters and are independent on instrumental factors. After accumulation of reference data it is reasonable to select one element, for example silicon, and transfer to the elemental sensitivity factors relative to silicon
(5)
The values of Sj are given on the corresonding pages of the Handbook.


"Handbook of Ionization Spectra"
ISBN 966-02-1954-7
© T. Afanasieva, I. Koval,V. Lysenko, P. Mel'nik, N. Nakhodkin, M. Pyatnitsky
Ukrainian National Academy of Science, Ukrainian Ministry of Education and Science
Taras Schevchenko University, Radiophysical department
tel.: +38(044)526-05-60
e-mail: afanasieva@univ.kiev.ua